"A Critical Scenario Filter to Accelerate Testing for Automated Vehicles."

Tian Xu et al. (2023)

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DOI: 10.1109/ITSC57777.2023.10422068

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-22

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Tian Xu, Xuerun Yan, Zhen Zhang, Jia Hu, Jintao Lai:
A Critical Scenario Filter to Accelerate Testing for Automated Vehicles. ITSC 2023: 3058-3060

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