"Pseudo fail bit map generation for RAMs during component test and burn-in ..."

Jörg E. Vollrath, Randall Rooney (2001)

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DOI: 10.1109/TEST.2001.966698

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jörg E. Vollrath, Randall Rooney:
Pseudo fail bit map generation for RAMs during component test and burn-in in a manufacturing environment. ITC 2001: 768-775

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