"A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter."

Masaki Tsukude et al. (1992)

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DOI: 10.1109/TEST.1992.527882

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsunori Suma, Kazuyasu Fujishima:
A Testing Technique for ULSI Memory with On-Chip Voltage Down Converter. ITC 1992: 615-622

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