"Automatic Structural Test Generation for Analog Circuits using Neural Twins."

Jonti Talukdar et al. (2022)

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DOI: 10.1109/ITC50671.2022.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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Jonti Talukdar, Arjun Chaudhuri, Mayukh Bhattacharya, Krishnendu Chakrabarty:
Automatic Structural Test Generation for Analog Circuits using Neural Twins. ITC 2022: 145-154

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