"Quick Analyses for Improving Reliability and Functional Safety of ..."

Stephen Sunter et al. (2020)

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DOI: 10.1109/ITC44778.2020.9325230

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Stephen Sunter, Michal Wolinski, Anthony Coyette, Ronny Vanhooren, Wim Dobbelaere, Nektar Xama, Jhon Gomez, Georges G. E. Gielen:
Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs. ITC 2020: 1-10

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