"Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED ..."

Hans Martin von Staudt et al. (2022)

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DOI: 10.1109/ITC50671.2022.00045

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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Hans Martin von Staudt, Luai Tarek Elnawawy, Sarah Wang, Larry Ping, Jung Woo Choi:
Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver IC. ITC 2022: 365-371

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