"Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal ..."

Nadun Sinhabahu et al. (2022)

> Home

Details and statistics

DOI: 10.1109/ITC50671.2022.00071

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/itc/SinhabahuLLWW22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/SinhabahuLLWW22
Nadun Sinhabahu, Katherine Shu-Min Li, Jian-De Li, J. R. Wang, Sying-Jyan Wang:
Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. ITC 2022: 554-558

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.