"Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to ..."

Stephen Pateras (2004)

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DOI: 10.1109/TEST.2004.1387421

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Stephen Pateras:
Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to Having Both. ITC 2004: 1413

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