default search action
"A bead probe CAD strategy for in-circuit test."
Kenneth P. Parker, Don DeMille (2007)
- Kenneth P. Parker, Don DeMille:
A bead probe CAD strategy for in-circuit test. ITC 2007: 1-8
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.