"Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with ..."

Jun-ichi Miyamoto et al. (1991)

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DOI: 10.1109/TEST.1991.519716

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-22

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Jun-ichi Miyamoto, Nobuaki Ohtsuka, Ken-ichi Imamiya, Naoto Tomita, Yumiko Iyama:
Multi-Step Stress Test for Yield Improvement of 16Mbit EPROMs with Redundancy Scheme. ITC 1991: 540-547

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