"Optimization of Tests for Managing Silicon Defects in Data Centers."

David P. Lerner et al. (2022)

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DOI: 10.1109/ITC50671.2022.00076

access: closed

type: Conference or Workshop Paper

metadata version: 2023-01-05

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David P. Lerner, Benson Inkley, Shubhada H. Sahasrabudhe, Ethan Hansen, Luis D. Rojas Munoz, Arjan van de Ven:
Optimization of Tests for Managing Silicon Defects in Data Centers. ITC 2022: 578-582

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