"Increased CMOS IC stuck-at fault coverage with reduced I DDQ ..."

Ronald R. Fritzemeier et al. (1990)

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DOI: 10.1109/TEST.1990.114051

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets. ITC 1990: 427-435

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