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Ronald R. Fritzemeier

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1990 – 1999

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1990
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Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins:
Zero defects or zero stuck-at faults-CMOS IC process improvement with I_DDQ. ITC 1990: 255-256
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Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins:
Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets. ITC 1990: 427-435

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