"Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI."

Yacoub M. El-Ziq, Richard J. Cloutier (1981)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2002-10-22

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Yacoub M. El-Ziq, Richard J. Cloutier:
Functional-Level Test Generation for Stuck-Open Faults in CMOS VLSI. ITC 1981: 536-546

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