"Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design."

Yacoub M. El-Ziq, Hamid H. Butt (1984)

> Home

Details and statistics

DOI: —

access: unavailable

type: Conference or Workshop Paper

metadata version: 2002-11-22

- no documents available
- export record
  dblp key:
  - conf/itc/El-ZiqB84
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/El-ZiqB84
Yacoub M. El-Ziq, Hamid H. Butt:
Impact of Mixed-Mode Self Test on Life Cycle Cost of VLSI Based Design. ITC 1984: 338-349

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.