"Multiple fault activation cycle tests for transistor stuck-open faults."

Narendra Devta-Prasanna et al. (2010)

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DOI: 10.1109/TEST.2010.5699313

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Narendra Devta-Prasanna, Arun Gunda, Sudhakar M. Reddy, Irith Pomeranz:
Multiple fault activation cycle tests for transistor stuck-open faults. ITC 2010: 821

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