"A stochastic pattern generation and optimization framework for ..."

V. R. Devanathan, C. P. Ravikumar, V. Kamakoti (2007)

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DOI: 10.1109/TEST.2007.4437596

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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V. R. Devanathan, C. P. Ravikumar, V. Kamakoti:
A stochastic pattern generation and optimization framework for variation-tolerant, power-safe scan test. ITC 2007: 1-10

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