"Improving Test Quality of Memory Chips by a Decision Tree-Based Screening ..."

Ya-Chi Cheng et al. (2022)

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DOI: 10.1109/ITC50671.2022.00080

access: closed

type: Conference or Workshop Paper

metadata version: 2023-12-17

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Ya-Chi Cheng, Pai-Yu Tan, Cheng-Wen Wu, Ming-Der Shieh, Chien-Hui Chuang, Gordon Liao:
Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. ITC 2022: 601-608

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