"Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal ..."

Degang Chen et al. (2013)

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DOI: 10.1109/TEST.2013.6651912

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Degang Chen, Zhongjun Yu, Krunal Maniar, Mojtaba Nowrozi:
Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations. ITC 2013: 1-9

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