"Test generation in VLSI circuits for crosstalk noise."

Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer (1998)

Details and statistics

DOI: 10.1109/TEST.1998.743208

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-21

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.