"Effective Path Selection for Delay Fault Testing of Sequential Circuits."

Tapan J. Chakraborty, Vishwani D. Agrawal (1997)

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DOI: 10.1109/TEST.1997.639716

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tapan J. Chakraborty, Vishwani D. Agrawal:
Effective Path Selection for Delay Fault Testing of Sequential Circuits. ITC 1997: 998-1003

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