"Ultra-low latency NoC testing via pseudo-random test pattern compaction."

Hervé Tatenguem et al. (2012)

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DOI: 10.1109/ISSOC.2012.6376370

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Hervé Tatenguem, Alessandro Strano, Vineeth Govind, Jaan Raik, Davide Bertozzi:
Ultra-low latency NoC testing via pseudo-random test pattern compaction. ISSoC 2012: 1-6

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