"Variability Analysis for sub-100nm PD/SOI Sense-Amplifier."

Saibal Mukhopadhyay et al. (2008)

> Home

Details and statistics

DOI: 10.1109/ISQED.2008.4479783

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/isqed/MukhopadhyayJKC08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/MukhopadhyayJKC08
Saibal Mukhopadhyay, Rajiv V. Joshi, Keunwoo Kim, Ching-Te Chuang:
Variability Analysis for sub-100nm PD/SOI Sense-Amplifier. ISQED 2008: 488-491

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.