"A yield improvement methodology based on logic redundant repair with a ..."

Masanori Kurimoto et al. (2010)

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DOI: 10.1109/ISQED.2010.5450455

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui:
A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule. ISQED 2010: 184-190

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