"Analysis of System-Level Reliability Factors and Implications on Real-Time ..."

Eric Karl, Dennis Sylvester, David T. Blaauw (2008)

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DOI: 10.1109/ISQED.2008.4479763

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Eric Karl, Dennis Sylvester, David T. Blaauw:
Analysis of System-Level Reliability Factors and Implications on Real-Time Monitoring Methods for Oxide Breakdown Device Failures. ISQED 2008: 391-395

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