"Modeling of Random Telegraph Noise under circuit operation - Simulation ..."

Kyosuke Ito et al. (2011)

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DOI: 10.1109/ISQED.2011.5770698

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Kyosuke Ito, Takashi Matsumoto, Shinichi Nishizawa, Hiroki Sunagawa, Kazutoshi Kobayashi, Hidetoshi Onodera:
Modeling of Random Telegraph Noise under circuit operation - Simulation and measurement of RTN-induced delay fluctuation. ISQED 2011: 22-27

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