"Self-heating effects in gate-all-around silicon nanowire MOSFETs: Modeling ..."

Xin Huang et al. (2012)

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DOI: 10.1109/ISQED.2012.6187572

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Xin Huang, Tianwei Zhang, Runsheng Wang, Changze Liu, Yuchao Liu, Ru Huang:
Self-heating effects in gate-all-around silicon nanowire MOSFETs: Modeling and analysis. ISQED 2012: 727-731

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