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"Quality of Electronic Design: From Architectural Level to Test Coverage."

Octávio Páscoa Dias et al. (2000)

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DOI: 10.1109/ISQED.2000.838874

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  - https://dblp.org/rec/conf/isqed/DiasSSTT00
Octávio Páscoa Dias, Jorge Semião, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira:
Quality of Electronic Design: From Architectural Level to Test Coverage. ISQED 2000: 197-

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