"Analysis, modeling and silicon correlation of low-voltage flop data ..."

Animesh Datta et al. (2013)

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DOI: 10.1109/ISQED.2013.6523669

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Animesh Datta, Mohamed H. Abu-Rahma, Sachin Dileep Dasnurkar, Hadi Rasouli, Sean Tamjidi, Ming Cai, Samit Sengupta, P. R. Chidambaram, Raghavan Thirumala, Nikhil Kulkarni, Prasanna Seeram, Prasad Bhadri, Prayag Patel, Sei Seung Yoon, Esin Terzioglu:
Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. ISQED 2013: 580-584

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