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"A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm ..."
Choongyeun Cho et al. (2007)
- Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski:
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology. ISQED 2007: 699-702
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