"Robust gate sizing via mean excess delay minimization."

Jason Cong, John Lee, Lieven Vandenberghe (2008)

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DOI: 10.1145/1353629.1353634

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Jason Cong, John Lee, Lieven Vandenberghe:
Robust gate sizing via mean excess delay minimization. ISPD 2008: 10-14

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