"Si-Backside Side-Channel Leakage Measurement and Simulation."

Rikuu Hasegawa et al. (2024)

> Home

Details and statistics

DOI: 10.1109/ISOCC62682.2024.10762019

access: closed

type: Conference or Workshop Paper

metadata version: 2024-12-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isocc/HasegawaMWMNLKC24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isocc/HasegawaMWMNLKC24
Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata, Lang Lin, Akhilesh Kumar, Norman Chang:
Si-Backside Side-Channel Leakage Measurement and Simulation. ISOCC 2024: 189-190

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.