"Simultaneous gate sizing and Vt assignment using Fanin/Fanout ratio and ..."

Tiago Reimann et al. (2013)

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DOI: 10.1109/ISCAS.2013.6572398

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-22

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Tiago Reimann, Gracieli Posser, Guilherme Flach, Marcelo O. Johann, Ricardo Reis:
Simultaneous gate sizing and Vt assignment using Fanin/Fanout ratio and Simulated Annealing. ISCAS 2013: 2549-2552

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