"Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit."

Arne Heittmann, Tobias G. Noll (2014)

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DOI: 10.1109/ISCAS.2014.6865470

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Arne Heittmann, Tobias G. Noll:
Variability analysis of a hybrid CMOS/RS nanoelectronic calibration circuit. ISCAS 2014: 1656-1659

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