"Electric field for detecting open leads in CMOS logic circuits by supply ..."

Masaki Hashizume et al. (2005)

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DOI: 10.1109/ISCAS.2005.1465257

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada:
Electric field for detecting open leads in CMOS logic circuits by supply current testing. ISCAS (3) 2005: 2995-2998

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