"Unified approach for simulation of statistical reliability in nanoscale ..."

A. Asenov et al. (2015)

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DOI: 10.1109/ISCAS.2015.7169180

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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A. Asenov, Jie Ding, Dave Reid, Plamen Asenov, Salvatore M. Amoroso, Fikru Adamu-Lema, Louis Gerrer:
Unified approach for simulation of statistical reliability in nanoscale CMOS transistors from devices to circuits. ISCAS 2015: 2449-2452

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