"Charge Trapping in Irradiated 3D Devices and ICs (Invited)."

En Xia Zhang et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529460

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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En Xia Zhang, Shintaro Toguchi, Zi Xiang Guo, Michael L. Alles, Ronald D. Schrimpf, Daniel M. Fleetwood:
Charge Trapping in Irradiated 3D Devices and ICs (Invited). IRPS 2024: 10

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