"Electromigration Test Chip Experiments from Realistic Power Grid ..."

Yong Hyeon Yi et al. (2024)

> Home

Details and statistics

DOI: 10.1109/IRPS48228.2024.10529449

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/YiKKVMS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/YiKKVMS24
Yong Hyeon Yi, Chris H. Kim, Armen Kteyan, Alexander Volkov, Stéphane Moreau, Valeriy Sukharev:
Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis. IRPS 2024: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.