"Characterization of Backside ESD Impacts on Integrated Circuits."

Takuya Wadatsumi et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118240

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Takuya Wadatsumi, Kohei Kawai, Rikuu Hasegawa, Kazuki Monta, Takuji Miki, Makoto Nagata:
Characterization of Backside ESD Impacts on Integrated Circuits. IRPS 2023: 1-6

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