"Multi-cell soft errors at the 16-nm FinFET technology node."

N. Tam et al. (2015)

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DOI: 10.1109/IRPS.2015.7112730

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, Dennis R. Ball, Michael W. McCurdy, Michael L. Alles, Indranil Chatterjee:
Multi-cell soft errors at the 16-nm FinFET technology node. IRPS 2015: 4

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