"Soft- and Hard-Error Radiation Reliability of 228 KB ..."

H. Takahashi et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118302

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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H. Takahashi, Y. Okamoto, Toshiki Hamada, Yusuke Komura, S. Watanabe, K. Tsuda, H. Sawai, Takanori Matsuzaki, Yoshinori Ando, Tatsuya Onuki, Hitoshi Kunitake, Shunpei Yamazaki, D. Kobayashi, A. Ikuta, Takahiro Makino, Takeshi Ohshima:
Soft- and Hard-Error Radiation Reliability of 228 KB $3\mathrm{T}+1\mathrm{C}$ Oxide Semiconductor Memory. IRPS 2023: 1-6

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