"Investigation of Interplays between Body Biasing and Hot Carrier ..."

Zixuan Sun et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529482

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Zixuan Sun, Yongkang Xue, Haoran Lu, Pengpeng Ren, Zirui Wang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Interplays between Body Biasing and Hot Carrier Degradation (HCD) in Advanced NMOS FinFETs. IRPS 2024: 72

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