"Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET ..."

Zixuan Sun et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117840

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-03

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Zixuan Sun, Haoran Lu, Yongkang Xue, Wenpu Luo, Zirui Wang, Jiayang Zhang, Zhigang Ji, Runsheng Wang, Ru Huang:
Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. IRPS 2023: 1-6

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