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"Investigation of different screening methods on threshold voltage and gate ..."
Limeng Shi et al. (2023)
- Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu:
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. IRPS 2023: 1-7
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