"The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm ..."

Dishant Sangani et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118026

access: closed

type: Conference or Workshop Paper

metadata version: 2024-08-04

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Dishant Sangani, Javier Diaz-Fortuny, Erik Bury, Ben Kaczer, Georges G. E. Gielen:
The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper). IRPS 2023: 1-6

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