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"Reversible dielectric breakdown in h-BN stacks: a statistical study of the ..."

Juan Bautista Roldán et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129147

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  dblp key:
  - conf/irps/RoldanMJARAHKSJ20
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  - https://dblp.org/rec/conf/irps/RoldanMJARAHKSJ20
Juan Bautista Roldán, David Maldonado, Francisco Jiménez-Molinos, Christian Acal, Juan Eloy Ruiz-Castro, Ana M. Aguilera, Fei Hui, J. Kong, Y. Shi, Xu Jing, Chao Wen, Marco Antonio Villena, Mario Lanza:
Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages. IRPS 2020: 1-5

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