"Investigation of the Electron Trapping in Commercial Thick Silicon ..."

Jiashu Qian et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529389

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Jiashu Qian, Limeng Shi, Michael Jin, Monikuntala Bhattacharya, Hengyu Yu, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu, Shengnan Zhu:
Investigation of the Electron Trapping in Commercial Thick Silicon Dioxides Thermally Grown on 4H-SiC under the Constant Current Stress. IRPS 2024: 1-6

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