"Influence of the magnetic field on dielectric breakdown in memristors ..."

David Maldonado et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128325

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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David Maldonado, Juan Bautista Roldán, Andrés M. Roldán, Francisco Jiménez-Molinos, Fei Hui, Y. Shi, Xu Jing, Chao Wen, Mario Lanza:
Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks. IRPS 2020: 1-5

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