default search action
"Correlated Effects of Radiation and Hot Carrier Degradation on the ..."
Bikram Kishore Mahajan et al. (2022)
- Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam:
Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors. IRPS 2022: 52-1
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.