"BVDSS (drain to source breakdown voltage) instability in shielded gate ..."

Jifa Hao et al. (2018)

> Home

Details and statistics

DOI: 10.1109/IRPS.2018.8353643

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/HaoGRYA18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/HaoGRYA18
Jifa Hao, Amartya Ghosh, Mark Rinehimer, Joe Yedinak, Muhammad Ashraful Alam:
BVDSS (drain to source breakdown voltage) instability in shielded gate trench power MOSFETs. IRPS 2018: 6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.